United States tariff line 9031.49.70.00: For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices
Last updated
Key facts
- Tariff line
- 9031.49.70.00
- Covers
- Other optical instruments and appliances, for inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices
- Duty (MFN)
- Free
- Additional duties
- None recorded
- Restrictions
- None recorded
- Tariff
- United States
- HS subheading
- 9031.49
Summary
In the United States tariff, line 9031.49.70.00 covers other optical instruments and appliances, for inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices. Goods under this line enter free of general (MFN) duty. It falls under HS subheading 9031.49 in heading 90.31 (chapter 90).
What this line covers
In the United States tariff, line 9031.49.70.00 covers other optical instruments and appliances, for inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices.
Its legal text is “For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices”, read under “Other optical instruments and appliances” and “Other”.
How it is structured
It falls under HS subheading 9031.49 in heading 90.31 (chapter 90). The first six digits are the Harmonized System code; the 4 digits after them are added by the United States tariff.
- Chapter 90
- Optical, photographic, cinematographic, measuring, checking, precision, medical or surgical instruments and apparatus; parts and accessories thereof
- Heading 90.31
- Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof
- Subheading 9031.49
- Other optical instruments and appliances
- Within the subheading
- Other
- Line 9031.49.70.00
- For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices
Duty
Goods under this line enter free of general (MFN) duty.
Other lines under 9031.49
- 9031.49.10.00Profile projectors
- 9031.49.40.00Coordinate-measuring machines
- 9031.49.90.00Other
In other countries
No other national tariff on border.bot has live lines under 9031.49 yet.
Frequently asked questions
What does tariff line 9031.49.70.00 cover in the United States tariff?
In the United States tariff, line 9031.49.70.00 covers other optical instruments and appliances, for inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices.
What is the general (MFN) duty on 9031.49.70.00 in the United States?
Goods under this line enter free of general (MFN) duty.
Sources and updates
The tariff lines for the United States come from border.bot release 1 (edition 2026HTSRev21), read from the publisher’s files, and have been live since 9 October 2026.
The duty rates for the United States come from border.bot release 1 (edition 2026HTSRev21), read from the publisher’s files, and have been live since 9 October 2026.
The trade programmes for the United States come from border.bot release 1 (edition 2026HTSRev21), read from the publisher’s files, and have been live since 9 October 2026.
This page was last updated on 9 October 2026.
Guidance from published tariff data, not a binding ruling. For a decision customs must follow, apply to the destination’s customs authority for a binding tariff ruling.
Official source files: